High Resolution, Soft Tapping Mode AFM Probe
The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.
AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The coating does not cover the spike.
|Shape Supersharp||Height 15 µm (12 - 18 µm)*||Radius < 1 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 0.5 N/m(0.05 - 2.3 N/m)*||Res. Freq. 65 kHz(25 - 120 kHz)*||Length 125 µm(1 - 130µm)*||Width 22.5 µm(19.5 - 25.5µm)*||Thickness 1µm(0.5 - 1.5 µm)*|
* typical values