Conductive Contact Mode AFM Probe
AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.
AFM Probe Specifications
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 30 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 0.18 N/m(0.06 - 0.4 N/m)*||Res. Freq. 13 kHz(10 - 17 kHz)*||Length 450 µm(1 - 455µm)*||Width 50 µm(47 - 53µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
* typical values