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Other coatings:

  • No coating:
    HQ:CSC38/No Al
  • Chromium-Gold coating:
    HQ:CSC38/Cr-Au

    • More AFM probes with Backside Aluminum coating

    HQ:CSC38/Al BS

    Probe

    HQ probe tip close-up
    • 8 nm
    • 8 nm
    • < 8 nm
    • 40°
    • 12 - 18 µm
    • n-type silicon
    • 0.01 - 0.025 Ohm*cm
    • Aluminum

    Cantilever

    SEM image of 3 cantilevers on
    chip (CSC37/38 series)
    Schematic drawing of 3 cantilevers on chip
    (CSC37/38 series)


    CSC38,
    Cantilevers    		 Resonance Frequency, kHz Force Constant, N/m Length
    l ± 5,
    µm     		Width
    w ± 3,
    µm     		Thickness
    t ± 0.5,
    µm
    min typ max min typ max
    Cantilever A 8 20 32 0.01 0.09 0.36 250 32.5 1.0
    Cantilever B 5 10 17 0.003 0.03 0.13 350 32.5 1.0
    Cantilever C 6 14 23 0.005 0.05 0.21 300 32.5 1.0
    *The full cone angle may be less than 40° at the last 200 nm of the tip end.