HQ:DMD-XSC11
AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers
AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
A wear resistant and electrically conductive doped diamond coating with thickness around 100 nm is applied on the tip side of the AFM cantilevers. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.
Coating
Conductive Diamond
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm) | Full Cone Angle 40° | Radius < 250 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 0.5 N/m(0.25 - 1 N/m) | Res. Freq. 18 kHz(15 - 22 kHz) | Length 500 µm(495 - 505µm) | Width 30 µm(27 - 33µm) | Thickness 2.7 µm(2.2 - 3.2 µm) |
| Cantilever Cantilever B | Shape Beam | Force Const. 6.5 N/m(3.5 - 10 N/m) | Res. Freq. 110 kHz(90 - 130 kHz) | Length 210 µm(205 - 215µm) | Width 30 µm(27 - 33µm) | Thickness 2.7 µm(2.2 - 3.2 µm) |
| Cantilever Cantilever C | Shape Beam | Force Const. 18 N/m(10 - 30 N/m) | Res. Freq. 210 kHz(170 - 250 kHz) | Length 150 µm(145 - 155µm) | Width 30 µm(27 - 33µm) | Thickness 2.7 µm(2.2 - 3.2 µm) |
| Cantilever Cantilever D | Shape Beam | Force Const. 95 N/m(55 - 175 N/m) | Res. Freq. 450 kHz(350 - 575 kHz) | Length 100 µm(95 - 105µm) | Width 50 µm(47 - 53µm) | Thickness 2.7 µm(2.2 - 3.2 µm) |
All typical values
