AFM Probe with 4 Different Low Noise Conductive AFM Cantilevers
AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The DPE AFM probes have a special structure of conductive layers applied to the tip side of the AFM cantilevers that provides a better signal-to-noise ratio in the AFM scans of electric properties. The coating thickness is increased, which gives more freedom for using the DPE AFM probes in contact electrical modes. The AFM probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The DPE AFM probes can be used in dynamic electric modes when a study of the electric properties of a sample has higher priority.
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 40 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 0.2 N/m(0.1 - 0.4 N/m)*||Res. Freq. 15 kHz(12 - 18 kHz)*||Length 500 µm(1 - 505µm)*||Width 30 µm(27 - 33µm)*||Thickness 2.7µm(2.2 - 3.2 µm)*|
|Cantilever Cantilever B||Shape Beam||Force Const. 2.7 N/m(1.1 - 5.6 N/m)*||Res. Freq. 80 kHz(60 - 100 kHz)*||Length 210 µm(1 - 215µm)*||Width 30 µm(27 - 33µm)*||Thickness 2.7µm(2.2 - 3.2 µm)*|
|Cantilever Cantilever C||Shape Beam||Force Const. 7 N/m(3 - 16 N/m)*||Res. Freq. 155 kHz(115 - 200 kHz)*||Length 150 µm(1 - 155µm)*||Width 30 µm(27 - 33µm)*||Thickness 2.7µm(2.2 - 3.2 µm)*|
|Cantilever Cantilever D||Shape Beam||Force Const. 42 N/m(17 - 90 N/m)*||Res. Freq. 350 kHz(250 - 465 kHz)*||Length 100 µm(1 - 105µm)*||Width 50 µm(47 - 53µm)*||Thickness 2.7µm(2.2 - 3.2 µm)*|
* typical values