HQ:DPER-XSC11

AFM Probe with 4 Different High Resolution Conductive AFM Cantilevers


AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

The overall platinum coating is electrically conductive and chemically inert. The thickness of the DPER tip side coating is about 15 nm on the flat cantilever surface, resulting in a coated AFM tip radius below 20 nm. The AFM probes can be used for imaging samples with higher resolution in XY directions.

Coating

Electrically Conductive

AFM Probe Specifications
AFM Tip
Shape Height Full Cone Angle Radius
Shape Rotated Height 15 µm (12 - 18 µm)* Full Cone Angle 40° Radius < 20 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Beam Force Const. 0.2 N/m(0.1 - 0.4 N/m)* Res. Freq. 15 kHz(12 - 18 kHz)* Length 500 µm(1 - 505µm)* Width 30 µm(27 - 33µm)* Thickness 2.7µm(2.2 - 3.2 µm)*
Cantilever Cantilever B Shape Beam Force Const. 2.7 N/m(1.1 - 5.6 N/m)* Res. Freq. 80 kHz(60 - 100 kHz)* Length 210 µm(1 - 215µm)* Width 30 µm(27 - 33µm)* Thickness 2.7µm(2.2 - 3.2 µm)*
Cantilever Cantilever C Shape Beam Force Const. 7 N/m(3 - 16 N/m)* Res. Freq. 155 kHz(115 - 200 kHz)* Length 150 µm(1 - 155µm)* Width 30 µm(27 - 33µm)* Thickness 2.7µm(2.2 - 3.2 µm)*
Cantilever Cantilever D Shape Beam Force Const. 42 N/m(17 - 90 N/m)* Res. Freq. 350 kHz(250 - 465 kHz)* Length 100 µm(1 - 105µm)* Width 50 µm(47 - 53µm)* Thickness 2.7µm(2.2 - 3.2 µm)*

* typical values

Packages Price
HQ:DPER-XSC11-15 15 pcs * 510 USD
510 USD
HQ:DPER-XSC11-50 50 pcs * 1500 USD
1500 USD
HQ:DPER-XSC11-100 100 pcs * 2600 USD
2600 USD
* Total: 0 USD
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