Ordering

Mix and Match enables you to create a custom MikroMasch AFM probes box with quantities of 100, 150, 200, 250, 300, 350 or 400pcs. inside where you can mix different probe types in units of 50 pcs.

The more units of 50 AFM probes you order, the higher your discount will be from the 50 probes list prices of each variety ordered:

10% discount for 100pcs.
15% discount for 150pcs.
20% discount for 200pcs.
25% discount for 250pcs.
30% discount for 300pcs.
35% discount for 350pcs.
40% discount for 400pcs.

Go to Mix&Match Box page »

Order in a Mix&Match Box

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*All prices displayed are based on geolocation and therefore preliminary. For binding prices, please log on with your user data or create an account.

Other coatings:

Chromium-Gold coating:
HQ:NSC14/Cr-Au

No coating:
HQ:NSC14/No Al

Hard Diamond Like Carbon coating, Backside Aluminum coating:
HQ:NSC14/Hard/Al BS

Platinum coating:
HQ:NSC14/Pt

Backside Chromium-Gold coating:
HQ:NSC14/Cr-Au BS

More AFM probes with Backside Aluminum coating

Standard Tapping Mode AFM Probe:
HQ:NSC15/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe:
HQ:NSC15/Hard/Al BS

AFM Probe with 3 Different Tapping Mode Cantilevers:
HQ:NSC35/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Tapping Mode Cantilevers:
HQ:NSC35/Hard/Al BS

Magnetic Lift Mode and Force Modulation AFM Probe:
HQ:NSC18/Co-Cr/Al BS

Standard Lift Mode and Force Modulation AFM Probe:
HQ:NSC18/Al BS

AFM Probe with 3 Different Tapping Mode Cantilevers:
HQ:NSC36/Al BS

Magnetic AFM Probe with 3 Different Cantilevers:
HQ:NSC36/Co-Cr/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Tapping Mode Cantilevers:
HQ:NSC36/Hard/Al BS

AFM Probe with 4 Different Cantilevers for Various Applications:
HQ:XSC11/Al BS

AFM Probe with 4 Different Long Scanning, DLC Hardened Cantilevers:
HQ:XSC11/Hard/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers:
HQ:CSC38/Al BS

Long Scanning, DLC Hardened, Soft Tapping Mode AFM Probe:
HQ:NSC14/Hard/Al BS

Standard Contact Mode AFM Probe:
HQ:CSC17/Al BS

Long Scanning, DLC Hardened Contact Mode AFM Probe:
HQ:CSC17/Hard/Al BS

Tipless AFM Probe with 3 Different Contact Mode Cantilevers:
HQ:NSC36/tipless/Al BS

Tipless AFM Probe with 3 Different Contact Mode Cantilevers:
HQ:CSC38/tipless/Al BS

Tipless AFM Probe with 3 Different Tapping Mode Cantilevers:
HQ:NSC35/tipless/Al BS

Tipless AFM Probe with 3 Different Tapping Mode Cantilevers:
HQ:CSC37/tipless/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers:
HQ:CSC37/Al BS

Very Soft Tapping Mode and LFM AFM Probe:
HQ:NSC19/Al BS

Low Frequency Tapping Mode AFM Probe with Long Cantilever:
HQ:NSC16/Al BS

Low Frequency Long Scanning, DLC Hardened Tapping Mode AFM Probe with Long Cantilever:
HQ:NSC16/Hard/Al BS

HQ:NSC18/Hard/ Al BS

Hide List

HQ:NSC14/Al BS

Probe

HQ probe tip close-up

Typical radius of uncoated tip 8 nm
Typical spike radius 8 nm
Spike height
Resulting tip radius with the coating < 8 nm
Full tip cone angle* 40°
Total tip height 12 - 18 µm
Probe material n-type silicon
Probe bulk resistivity 0.01 - 0.025 Ohm*cm
Tip coating
Detector coating Aluminum

MikroMasch HQ Line Product Screencast - NSC14,NSC15 and NSC16 Series

MikroMasch HQ Line Product Screencast - Series HQ:NSC14, HQ:NSC15 and HQ:NSC16 presented by Dr. Penka Terziyska, Product Manager
www.spmtips.com

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Cantilever

SEM image of the cantilever

Schematic drawing of the cantilever

Cantilever	Resonance Frequency, kHz			Force Constant, N/m			Length l ± 5, µm	Width w ± 3, µm	Thickness t ± 0.5, µm
Cantilever	min	typ	max	min	typ	max	Length l ± 5, µm	Width w ± 3, µm	Thickness t ± 0.5, µm
14 Series	110	160	220	1.8	5	13	125	25	2.1

*The full cone angle may be less than 40° at the last 200 nm of the tip end.

Polymer Spherulite on Mica. 10 µm topography scan. Image obtained on Smart SPM ( AIST-NT Inc, Novato, CA).

Image courtesy of Fedor Kraev, UC Davis
4 µm topography image and corresponding section analysis of a single layer graphene oxide flake on mica. Image obtained on Smart SPM ( AIST-NT Inc, Novato, CA)

Image courtesy of Fedor Kraev, UC Davis
200nm topography scan of SAM of Palmityl Palmitate on HOPG. Image obtained with closed loop in XY using Smart SPM ( AIST-NT Inc, Novato, CA).

Image courtesy of Fedor Kraev, UC Davis
20x20 nm topography (left) and the phase shift image of SAM of Cholesteryl Stearate on HOPG. True molecular resolution is achieved in ambient conditions using SmartSPM ( AIST-NT Inc. Novato, CA)

Image courtesy of Dmitry Evplov, AIST-NT Inc
20x20 nm topography (left) and the phase shift image of SAM of Cholesteryl Stearate on HOPG. True molecular resolution is achieved in ambient conditions using SmartSPM ( AIST-NT Inc. Novato, CA)

Image courtesy of Dmitry Evplov, AIST-NT Inc
15 nm topography scan of SAM of Cholesteryl Stearate on HOPG. Image obtained using SmartSPM ( AIST-NT Inc, Novato, CA)

Image courtesy of Andrey Krayev, AIST-NT Inc

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Ordering

Other coatings:

HQ:NSC14/Al BS

Probe

MikroMasch HQ Line Product Screencast - NSC14,NSC15 and NSC16 Series

Cantilever