Long Scanning, DLC Hardened, Soft Tapping Mode AFM Probe
AFM probes of the HQ:NSC14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
A 20 nm wear-resistant DLC coating is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than silicon with a natural oxide layer. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 20 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 5 N/m(1.8 - 13 N/m)*||Res. Freq. 160 kHz(110 - 220 kHz)*||Length 125 µm(1 - 130µm)*||Width 25 µm(22 - 28µm)*||Thickness 2.1µm(1.6 - 2.6 µm)*|
* typical values