Standard Tapping Mode AFM Probe
AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC15/Cr-Au BS with a reflective gold coating.
AFM Probe Specifications
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 8 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 40 N/m(20 - 80 N/m)*||Res. Freq. 325 kHz(265 - 410 kHz)*||Length 125 µm(1 - 130µm)*||Width 30 µm(27 - 33µm)*||Thickness 4µm(3.5 - 4.5 µm)*|
* typical values