Long Scanning, DLC Hardened Tapping Mode AFM Probe
AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
A 20 nm wear-resistant DLC coating is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than silicon with a natural oxide layer. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 20 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 40 N/m(20 - 80 N/m)*||Res. Freq. 325 kHz(265 - 410 kHz)*||Length 125 µm(1 - 130µm)*||Width 30 µm(27 - 33µm)*||Thickness 4µm(3.5 - 4.5 µm)*|
* typical values