HQ:NSC15/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe


AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

A 20 nm wear-resistant DLC coating is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than silicon with a natural oxide layer. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.

Coating

Hard Diamond-Like-Carbon

AFM Probe Specifications
AFM Tip
Shape Height Full Cone Angle Radius
Shape Rotated Height 15 µm (12 - 18 µm)* Full Cone Angle 40° Radius < 20 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Beam Force Const. 40 N/m(20 - 80 N/m)* Res. Freq. 325 kHz(265 - 410 kHz)* Length 125 µm(1 - 130µm)* Width 30 µm(27 - 33µm)* Thickness 4µm(3.5 - 4.5 µm)*

* typical values

Packages Price
HQ:NSC15/Hard/Al BS-15 15 pcs * 495 USD
495 USD
HQ:NSC15/Hard/Al BS-50 50 pcs * 1350 USD
1350 USD
* Total: 0 USD
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