HQ:NSC16/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe with Long AFM Cantilever


AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

A 20 nm wear-resistant DLC coating is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than silicon with a natural oxide layer. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.

Coating

Hard Diamond-Like-Carbon

AFM Probe Specifications
AFM Tip
Shape Height Full Cone Angle Radius
Shape Rotated Height 15 µm (12 - 18 µm)* Full Cone Angle 40° Radius < 20 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Beam Force Const. 45 N/m(30 - 70 N/m)* Res. Freq. 190 kHz(170 - 210 kHz)* Length 225 µm(1 - 230µm)* Width 37.5 µm(34.5 - 40.5µm)* Thickness 7µm(6.5 - 7.5 µm)*

* typical values

Packages Price
HQ:NSC16/Hard/Al BS-15 15 pcs * 495 USD
495 USD
HQ:NSC16/Hard/Al BS-50 50 pcs * 1350 USD
1350 USD
* Total: 0 USD
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