Magnetic Force Microscopy AFM Probe
AFM probes of the HQ:NSC18 series are suitable for soft tapping and Lift mode operation AFM (e.g. EFM and MFM) since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM probes are also used for mapping of materials properties in Force modulation mode and true topography imaging of soft samples in Soft tapping mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The coating consists of a cobalt layer on the tip side and an aluminum reflective layer on the back side of the AFM cantilever. The cobalt layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis.
All AFM probes are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB. The cobalt coating is protected from oxidation by a thin chromium layer, resulting in longer AFM tip lifetime. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 60 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 2.8 N/m(1.2 - 5.5 N/m)*||Res. Freq. 75 kHz(60 - 90 kHz)*||Length 225 µm(1 - 230µm)*||Width 27.5 µm(24.5 - 30.5µm)*||Thickness 3µm(2.5 - 3.5 µm)*|
* typical values