Soft Tapping Mode and LFM AFM Probe
AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM probes are also used in Lateral force microscopy due to their high sensitivity to lateral forces.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
* ScanAsyst® and PeakForce Tapping™ are trademarks of Bruker Corporation
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 8 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 0.5 N/m(0.05 - 2.3 N/m)*||Res. Freq. 65 kHz(25 - 120 kHz)*||Length 125 µm(1 - 130µm)*||Width 22.5 µm(19.5 - 25.5µm)*||Thickness 1µm(0.5 - 1.5 µm)*|
* typical values