HQ:NSC19/No Al
Soft Tapping Mode and LFM AFM Probe
AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are not designed as dedicated ScanAsyst®* mode AFM probes, but they have been confirmed as compatible with Bruker ScanAsyst® PeakForce Tapping™* mode by many customers all over the world. These AFM probes are also used in Lateral force microscopy due to their high sensitivity to lateral forces.
The monolithic silicon HQ AFM probes offer high consistency of the AFM tip radius, cantilever reflectivity and quality factor.
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| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm) | Full Cone Angle 40° | Radius < 8 nm |
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 0.5 N/m(0.05 - 2.3 N/m) | Res. Freq. 65 kHz(25 - 120 kHz) | Length 125 µm(120 - 130µm) | Width 22.5 µm(19.5 - 25.5µm) | Thickness 1 µm(0.5 - 1.5 µm) |
All typical values
