AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers
AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 35 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 8.9 N/m(2.7 - 24 N/m)*||Res. Freq. 205 kHz(130 - 290 kHz)*||Length 110 µm(1 - 115µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
|Cantilever Cantilever B||Shape Beam||Force Const. 16 N/m(4.8 - 44 N/m)*||Res. Freq. 300 kHz(185 - 430 kHz)*||Length 90 µm(1 - 95µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
|Cantilever Cantilever C||Shape Beam||Force Const. 5.4 N/m(1.7 - 14 N/m)*||Res. Freq. 150 kHz(95 - 205 kHz)*||Length 130 µm(1 - 135µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
* typical values