AFM Probe with 3 Different Long Scanning, DLC Hardened Soft Tapping Mode AFM Cantilevers
AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
A 20 nm wear-resistant DLC coating is applied to the tip side of the AFM cantilevers. The coating is chemically inert and more hydrophobic than silicon with a natural oxide layer. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.
|Shape||Height||Full Cone Angle||Radius|
|Shape Rotated||Height 15 µm (12 - 18 µm)*||Full Cone Angle 40°||Radius < 20 nm|
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Cantilever A||Shape Beam||Force Const. 8.9 N/m(2.7 - 24 N/m)*||Res. Freq. 205 kHz(130 - 290 kHz)*||Length 110 µm(1 - 115µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
|Cantilever Cantilever B||Shape Beam||Force Const. 16 N/m(4.8 - 44 N/m)*||Res. Freq. 300 kHz(185 - 430 kHz)*||Length 90 µm(1 - 95µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
|Cantilever Cantilever C||Shape Beam||Force Const. 5.4 N/m(1.7 - 14 N/m)*||Res. Freq. 150 kHz(95 - 205 kHz)*||Length 130 µm(1 - 135µm)*||Width 35 µm(32 - 38µm)*||Thickness 2µm(1.5 - 2.5 µm)*|
* typical values