XNC12/Cr-Au

AFM Probe with Gold Coated  Silicon Nitride AFM Cantilevers


AFM probes of the XNC12 series have 2 silicon nitride AFM cantilevers and AFM tips on a glass holder chip. They are used for soft contact mode applications.

The overall gold coating with 20 nm chromium sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers. The coating may cause AFM cantilever bending up to 3°

Coating

Gold Overall

AFM Probe Specifications
AFM Tip
Shape Height Full Cone Angle Radius
Shape Pyramid Height 3.5 µm Full Cone Angle 40° Radius < 10 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Triangle Force Const. 0.08 N/m Res. Freq. 17 kHz Length 200 µm(1 - 210µm)* Width 28 µm(23 - 33µm)* Thickness 500nm(425 - 575 nm)*
Cantilever Cantilever B Shape Triangle Force Const. 0.32 N/m Res. Freq. 67 kHz Length 100 µm(1 - 110µm)* Width 13.5 µm(8.5 - 18.5µm)* Thickness 500nm(425 - 575 nm)*

* typical values

Packages Price
XNC12/Cr-Au-10 10 pcs * 295 USD
295 USD
XNC12/Cr-Au-35 35 pcs * 870 USD
870 USD
XNC12/Cr-Au-70 70 pcs * 1595 USD
1595 USD
* Total: 0 USD
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