PA01
AFM tip evaluation sample with sharp pyramidal structures
SEM image of the PA01 surfaceSample for characterization of AFM tip shape with hard sharp pyramidal nanostructures. The pyramids are triangular with base length in the range 50–100nm and height 50–150nm. The radius of curvature of the sharpest edges is below 5nm.
The structures of the PA01 are covered by a highly wear-resistant layer.| Part number | Pyramid base | Pyramid height | Smallest edge radii | Active area | Chip dimensions |
| PA01 | 50-100nm | 50-150nm | <5nm | 5×5mm | 5×5×0.7mm |
PA01 specifications
Application
AFM image of the PA01 surface. Scan taken with OPUS 240AC-NA probe with tip. Scan size 1µm, scan height 95nm.The exact shape of the AFM probe tip is very important for obtaining AFM images of high quality and accuracy. As new AFM tips with nanometer radii of curvature become widespread, periodic structures that have surface features of similar or greater sharpness should be used to estimate the parameters of the AFM tip.
An AFM image of the PA01 structures is shown below. The AFM image is obtained using an OPUS
