ScanAsyst®* AFM Probes

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Typical AFM tip radius
2nm
Maximum AFM tip radius
8nm
Full cone angle
40°
Total AFM tip height
Nom: 5µm
Range: 4-7µm
Effective AFM tip height
Nom: 2.5µm
Range: 2-3.5µm
AFM tip material
n-type silicon
AFM cantilever material
Silicon-based amorphous thin layer
Detector coating
Aluminum

The SelfAdjust-Air AFM cantilevers feature finely tuned properties, optimal for ScanAsyst®* mode operation.

The silicon AFM tips have trihedral shape and the sharpest silicon apexes in our entire product range with typical radius of curvature 2nm and maximum radius of curvature below 8nm. The full AFM tip cone angle is 40° and even lower at the last 200nm near the AFM tip apex.

The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.

We recommend using SelfAdjust-Air AFM tips for measurements in ScanAsyst® PeakForce Tapping™* mode. Alternatively, the soft tapping mode HQ:NSC19/Al BS AFM tips can be used and some customers even prefer them for measurements in ScanAsyst®* mode. However, SelfAdjust-Air have been designed specifically for ScanAsyst® PeakForce Tapping™* mode application and are therefore the preferred choice. For more information on the HQ series soft tapping mode AFM tips check here.

1-AFM Cantilevers Series

Application

SelfAdjust-Air AFM tips can be used for imaging both hard samples and soft biological samples in ScanAsyst® PeakForce Tapping™* mode. The low interaction force allows preserving both the AFM tip and the sample, allowing very high resolution scans.

Bruker’s Tip Qualification module is used to assess the sharpness of a SelfAdjust-Air AFM tip based on a scan of the MikroMasch® PA01 AFM tip evaluation sample.

SEBS-BH 2 µm AFM Images - MikroMasch® NSC19 Series and SelfAdjust-Air AFM Probes

OSC-Elastomer Blend 40 µm AFM Images – MikroMasch® SelfAdjust-Air AFM Probes

OSC-Elastomer Blend 1.5 µm AFM Images after nanomachining – MikroMasch® SelfAdjust-Air AFM Probes