Diamond AFM Probes

DMD AFM probes feature a thick doped diamond coating. The AFM tip shape is trihedral. The polycrystalline diamond structure ensures extreme durability at the expense of reduced resolution. The coating is also electrically conductive, allowing for electric measurements in contact mode (Conductive AFM, Tunnelling Current AFM, Scanning Spreading Resistance Microscopy).

Typical radius of uncoated AFM tip
8nm
Resulting AFM tip radius with the coating
<250nm
Full AFM tip cone angle
40°
Total AFM tip height
12-18µm
AFM probe material
n-type silicon
AFM tip coating
Conductive diamond
Detector coating
Aluminum

4 AFM Cantilever Series