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Diamond AFM Probes

  • HQ:DMD-XSC11
    HQ:DMD-XSC11
    AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers
    • 18/110/210/450 kHz 0.5/6.5/18/95 N/m

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  • Diamond coated AFM tip close-up Diamond coated AFM tip close-up

    Typical radius of uncoated AFM tip
    8nm
    Resulting AFM tip radius with the coating
    <250nm
    Full AFM tip cone angle
    40°
    Total AFM tip height
    12-18µm
    AFM probe material
    n-type silicon
    AFM tip coating
    Conductive diamond
    Detector coating
    Aluminum

    DMD AFM probes feature a thick doped diamond coating. The AFM tip shape is trihedral. The polycrystalline diamond structure ensures extreme durability at the expense of reduced resolution. The coating is also electrically conductive, allowing electrical measurements in contact mode such as Conductive AFM, Tunnelling Current AFM and Scanning Spreading Resistance Microscopy.

     

    4 AFM Cantilevers Series

    AFM CantileverResonance Frequency, kHzForce Constant, N/m
    mintypicalmaxmintypicalmax
    11 series Cantilever A 15 18 22 0.25 0.5 1
    Cantilever B 90 110 130 3.5 6.5 10
    Cantilever C 170 210 250 10 18 30
    Cantilever D 350 450 575 55 95 175