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Contact Mode AFM Probes

HQ probe tip close-up HQ AFM tip close-up

Typical radius of uncoated AFM tip
8 nm
Full AFM tip cone angle*
40°
Total AFM tip height
12 - 18 µm
AFM probe material
n-type silicon
AFM probe bulk resistivity
0.01 - 0.025 Ohm·cm

*The full cone angle may be less than 40° at the last 200nm of the AFM tip end.

The HQ:CSC and HQ:XSC AFM probe tips have trihedral shape. The contact mode AFM probes feature AFM cantilevers with low stiffness and force constants <0.4N/m. They offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.

The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.

There is a range of available AFM cantilever coatings for tip side and back side. Please check the other catalog categories for coated versions of standard tapping mode AFM probes.

The highly successful HQ series now extends over all AFM probe series with 1,3 and 4 AFM cantilevers.

1 AFM Cantilever Series
AFM CantileverResonance Frequency, kHzForce Constant, N/m
mintypicalmaxmintypicalmax
17 series 10 13 17 0.06 0.18 0.40



3 AFM Cantilever Series

AFM CantileverResonance Frequency, kHzForce Constant, N/m
mintypicalmaxmintypicalmax
37 series Cantilever A 30 40 55 0.3 0.8 2
Cantilever B 15 20 30 0.1 0.3 0.6
Cantilever C 20 30 40 0.1 0.4 1
38 series Cantilever A 8 20 32 0.01 0.09 0.36
Cantilever B 5 10 17 0.003 0.03 0.13
Cantilever C 6 14 23 0.005 0.05 0.21



4 AFM Cantilever Series

AFM CantileverResonance Frequency, kHzForce Constant, N/m
mintypicalmaxmintypicalmax
11 series Cantilever A 12 15 18 0.1 0.2 0.4
Cantilever B 60 80 100 1.1 2.7 5.6
Cantilever C 115 155 200 3 7 16
Cantilever D 250 350 465 17 42 90

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