Tapping Mode AFM Probes
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HQ:NSC15/Al BS
Standard Tapping Mode AFM Probe- 325 kHz 40 N/m
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HQ:XSC11/Al BS
AFM Probe with 4 Different Cantilevers for Various Applications- 15/80/155/350 kHz 0.2/2.7/7.0/42 N/m
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HQ:NSC15/Cr-Au BS
Gold Coated Tapping Mode AFM Probe- 325 kHz 40 N/m
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HQ:NSC15/No Al
Standard Tapping Mode AFM Probe- 325 kHz 40 N/m
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HQ:XSC11/No Al
AFM Probe with 4 Different Cantilevers for Various Applications- 15/80/155/350 kHz 0.2/2.7/7.0/42 N/m
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Videos
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HQ AFM tip close-upTypical radius of uncoated AFM tip
8 nm
Full AFM tip cone angle
40°
Total AFM tip height
12 - 18 µm
AFM probe material
n-type silicon
AFM probe bulk resistivity
0.01 - 0.025 Ohm·cmThe HQ:NSC and HQ:XSC AFM tips have trihedral shape with a full cone angle of 40° and even smaller at the last 200nm of the AFM tip apex. The standard tapping mode AFM probes feature stiff AFM cantilevers with high resonance frequencies and force constants above 40N/m. These AFM probes are generally used for imaging hard samples where high topographic and phase contrast are needed. They are also suitable for non-contact mode operation.
The optional aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.
There is a range of available AFM cantilever coatings for the tip side and back side. Please check the other catalog categories for coated versions of the standard tapping mode AFM probes.
The highly successful HQ series now extends over all AFM probe series with 1, 3 and 4 AFM cantilevers.
1 AFM Cantilever Series
AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 15 series 265 325 410 20 40 80 16 series 170 190 210 30 45 70 4 AFM Cantilevers Series
AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 11 series Cantilever A 12 15 18 0.1 0.2 0.4 Cantilever B 60 80 100 1.1 2.7 5.6 Cantilever C 115 155 200 3 7 16 Cantilever D 250 350 465 17 42 90
