probes

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HIGH RESOLUTION PROBES

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Hi'Res-C

PROBE

Hi’Res-C AFM probes have a diamond-like spike on the apex of the silicon tip. The sharpness of the spike determines the resolution.

*The spike is not coated!

Application

Hi'Res-C probes suffer less contamination than silicon SPM probes and allow obtaining many high-resolution scans when proper care is taken during use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.

The advantages of the Hi'Res-C probes are noticeable when scanning smaller areas (<250 nm) and flat samples. On larger images, the resolution is similar to that of general purpose probes. The Hi'Res-C probes are not suitable for corrugated samples.

1-cantilever series

Cantilever	Resonance Frequency, kHz			Force Constant, N/m
	min	typical	max	min	typical	max
14 series	110	160	220	1.8	5.0	13
15 series	265	325	410	20	40	80
18 series	60	75	90	1.2	2.8	5.5
19 series	25	65	120	0.05	0.5	2.3

ORDERING OPTIONS

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