Hi'Res-C

PROBE

  • 1 nm
  • 1 nm
  • 100 - 200 nm
  • < 1 nm
  • 40°
  • 12 - 18 µm
  • n-type silicon
  • 0.01 - 0.025 Ohm*cm
  • Gold*
  • Gold

Hi’Res-C AFM probes have a diamond-like spike on the apex of the silicon tip. The sharpness of the spike determines the resolution.

*The spike is not coated!

Application

Hi'Res-C probes suffer less contamination than silicon SPM probes and allow obtaining many high-resolution scans when proper care is taken during use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.

The advantages of the Hi'Res-C probes are noticeable when scanning smaller areas (<250 nm) and flat samples. On larger images, the resolution is similar to that of general purpose probes. The Hi'Res-C probes are not suitable for corrugated samples.



1-cantilever series

Cantilever Resonance Frequency, kHz Force Constant, N/m
mintypicalmax mintypicalmax
14 series 110 160 220 1.8 5.0 13
15 series 265 325 410 20 40 80
18 series 60 75 90 1.2 2.8 5.5
19 series 25 65 120 0.05 0.5 2.3
*The coating does not cover the spike

ORDERING OPTIONS

Click on a product type below to order online.

1-lever

  • 325 kHz (40 N/m)
    Hi'Res-C15/Cr-Au
  • 160 kHz (5 N/m)
    Hi'Res-C14/Cr-Au
  • 65 kHz (0.5 N/m)
    Hi'Res-C19/Cr-Au
  • 75 kHz (2.8 N/m)
    Hi'Res-C18/Cr-Au