Hi’Res-C AFM probes have a diamond-like spike on the apex of the silicon tip. The sharpness of the spike determines the resolution.
*The spike is not coated!
Hi'Res-C probes suffer less contamination than silicon SPM probes and allow obtaining many high-resolution scans when proper care is taken during use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.
The advantages of the Hi'Res-C probes are noticeable when scanning smaller areas (<250 nm) and flat samples. On larger images, the resolution is similar to that of general purpose probes. The Hi'Res-C probes are not suitable for corrugated samples.