- 8 nm
- < 20 nm
- 40°
- 12 - 18 µm
- n-type silicon
LONG SCANNING AFM PROBES
Application
Long Scanning probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.
Video
Probes
hard probes
HARD probes feature a thin DLC wear-resistant coating that increases the durability. The tip shape is trihedral.
dmd probes
DMD probes feature a thick doped diamond coating with unsurpassed durability. The tip shape is trihedral.
- 8 nm
- < 250 nm
- 40°
- 12 - 18 µm
- n-type silicon
ORDERING OPTIONS
Click on a product type below to order online.LONG SCANNING PROBES
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.
