LONG SCANNING AFM PROBES

Application

Long Scanning probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.

Height image of polystyrene-polybutadiene-polystyrene triblock copolymer. Scan obtained in Tapping mode using LS probe tip with radius about 30 nm. Image courtesy of S. Magonov (Veeco Instuments).

Video

Probes

hard probes

HARD probes feature a thin DLC wear-resistant coating that increases the durability. The tip shape is trihedral.

Typical radius of uncoated tip 8 nm
Typical spike radius 8 nm
Spike height
Resulting tip radius with the coating < 20 nm
Full tip cone angle* 40°
Total tip height 12 - 18 µm
Probe material n-type silicon
Probe bulk resistivity 0.01 - 0.025 Ohm*cm
Tip coating Hard Diamond-Like-Carbon
Detector coating Aluminum

ORDERING OPTIONS

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LONG SCANNING PROBES

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

20 nm radius hard DLC coated tips
HARD