CONDUCTIVE AFM PROBES

Though silicon is conducting in bulk due to the presence of the dopants, the surface of the probe is always coated by a thin (1 - 2 nm) native oxide film. That is why using the conductivity of Si probes for AFM measurements is only possible in UHV conditions after the film is removed.

For imaging of electric properties of materials in ambient conditions, probes with special conducting coatings are usually used.

Height image obtained in Tapping mode.

EFM map of the same area.

Height and phase images of the rubber-modified isotactic polypropylene filled with carbon black. The images were obtained in Electric Force Microscopy mode using NSC14 probes coated with Pt. Images courtesy of S. Magonov (Veeco).

Probes

dpe (low-noise) probes

Probes of the DPE series have a special structure of conducting layers applied to the tip that provides better signal to noise ratio on the scans of electric properties.

Typical radius of uncoated tip 8 nm
Typical spike radius 8 nm
Spike height
Resulting tip radius with the coating < 40 nm
Full tip cone angle* 40°
Total tip height 12 - 18 µm
Probe material n-type silicon
Probe bulk resistivity 0.01 - 0.025 Ohm*cm
Tip coating Platinum
Detector coating Platinum

dper probes

The DPER probes are made by depositing a thin Pt coating on Si tips. While the thickness of the coating on the flat cantilever surface is about 20 nm, there is only 10 nm increase of the tip dimensions compared to the bare Si probes.

Typical radius of uncoated tip 8 nm
Typical spike radius 8 nm
Spike height
Resulting tip radius with the coating < 20 nm
Full tip cone angle* 40°
Total tip height 12 - 18 µm
Probe material n-type silicon
Probe bulk resistivity 0.01 - 0.025 Ohm*cm
Tip coating Platinum
Detector coating Platinum

pt coated probes

Probes with overall conductive chemically inert 30 nm Pt coating. Resulting probe tip radius is below 30 nm.

Typical radius of uncoated tip 8 nm
Typical spike radius 8 nm
Spike height
Resulting tip radius with the coating < 30 nm
Full tip cone angle* 40°
Total tip height 12 - 18 µm
Probe material n-type silicon
Probe bulk resistivity 0.01 - 0.025 Ohm*cm
Tip coating Platinum
Detector coating Platinum

cr-au coated probes

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the cantilever. Resulting tip radius is below 50 nm.

Typical radius of uncoated tip 8 nm
Typical spike radius 8 nm
Spike height
Resulting tip radius with the coating < 35 nm
Full tip cone angle* 40
Total tip height 12 - 18 µm
Probe material n-type silicon
Probe bulk resistivity 0.01 - 0.025 Ohm*cm
Tip coating Gold
Detector coating Gold

ORDERING OPTIONS

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CONDUCTIVE PROBES

Probes with special coatings for conductive AFM modes.