High Quality AFM Probes

Resolution

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

Lateral resolution down to
5 nm for scan size below 1 μm.

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

Tipless cantilevers for various custom applications such as attaching spheres.

Probes with special coatings for conductive AFM modes.

Probes with magnetic coating for MFM.

Probes with silicon nitride cantilevers and tips.

15 series 325 kHz (40 N/m)

16 series 190 kHz (45 N/m)

14 series 160 kHz (5 N/m)

19 series 65 kHz (0.5 N/m)

18 series 75 kHz (2.8 N/m)

17 series 13 kHz (0.18 N/m)

35 series 150 - 300 kHz
(5.4 - 16 N/m)

36 series 65 - 130 kHz
(0.6 - 2 N/m)

37 series 20 - 40 kHz
(0.3 - 0.8 N/m)

38 series 10 - 20 kHz
(0.03 - 0.09 N/m)

11 series 15 - 350 kHz
(0.2 - 42 N/m)

12 series 17 - 67 kHz
(0.08 - 0.32 N/m)