Probes
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Introducing OPUS by MikroMasch
®
- Our New Line of AFM Probes with Tip Visibility! »
Resolution
HIGH RESOLUTION
Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.
1 nm radius tip
Hi'Res-C
GENERAL PURPOSE
Lateral resolution down to
5 nm for scan size below 1 μm.
8 nm radius trihedral silicon tip
HQ:NSC, CSC & XSC
LONG SCANNING
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.
20 nm radius hard DLC coated tips
HARD
Special Applications
TIPLESS
Tipless cantilevers for various custom applications such as attaching spheres.
Three tipless cantilevers per chip
Tipless
CONDUCTIVE
Probes with special coatings for conductive AFM modes.
40 nm radius tip
DPE (low-noise)
20 nm radius tip
DPER (high-resolution)
30 nm radius tip
Pt coated
35 nm radius tip
Cr-Au coated
MAGNETIC
Probes with magnetic coating for MFM.
60 nm radius magnetic tip
Co-Cr coated
SILICON NITRIDE
Probes with silicon nitride cantilevers and tips.
10-30 nm radius pyramidal tip
XNC12
Cantilevers
1-lever
15 series
325 kHz (40 N/m)
16 series
190 kHz (45 N/m)
14 series
160 kHz (5 N/m)
19 series
65 kHz (0.5 N/m)
18 series
75 kHz (2.8 N/m)
17 series
13 kHz (0.18 N/m)
3-lever
35 series
150 - 300 kHz
(5.4 - 16 N/m)
36 series
65 - 130 kHz
(0.6 - 2 N/m)
37 series
20 - 40 kHz
(0.3 - 0.8 N/m)
38 series
10 - 20 kHz
(0.03 - 0.09 N/m)
4-lever
11 series
15 - 350 kHz
(0.2 - 42 N/m)
12 series
17 - 67 kHz
(0.08 - 0.32 N/m)
OUR DISTRIBUTORS
Download OPUS Catalog
|
Download HQ:Tips Catalog
CONTACTS