Probes

Resolution

HIGH RESOLUTION

Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.

GENERAL PURPOSE

Lateral resolution down to
5 nm for scan size below 1 μm.

LONG SCANNING

Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.

Special Applications

TIPLESS

Tipless cantilevers for various custom applications such as attaching spheres.

MAGNETIC

Probes with magnetic coating for MFM.

SILICON NITRIDE

Probes with silicon nitride cantilevers and tips.