• Theory and Practice of SPM

    Theory and Practice of SPM

    This section comprises references to articles containing information on theoretical problems and fundamentals of Scanning Probe Microscopy issued mainly since 1996. Also, plenty of references to papers devoted to simulation and modeling experiments, as well as enhancements, improvements and developments of contemporary SPM methods and corresponding techniques are listed including those describing technical innovations and technological solutions.

    We purposely do not engage in reviewing existent theories and models of SPM since such comprehensive and, on the other hand, highly specialized (in respect to every SPM method or technique) survey inevitably would inflate into a little book and should be performed by a group of persons whose experience in this field has been accumulated during the mature part of SPM history.

    Most of the references to articles devoted to conceptual problems related to biology, AFM probes and AFM  cantilevers are considered mainly in the appropriate sections of our Library and, as a rule, are not reflected here.

    An attempt to classify different SPM methods and techniques probably has been undertaken by Friedbacher and Fuchs [], though some relatively well established techniques such as Conductive AFM (or Scanning Spreading Resistance Microscopy, SSRM) are not mentioned in this paper.

    ID Reference list (newly come references are marked red)
    985 A fast and versatile scan unit for scanning probe microscopy.
    Knebel D., Amrein M., Voigt K., Reichelt R.
    Scanning 19 (1997) 264-268.
    10 A mechanical approach to the dissipation process in NC-AFM: experiments, model and simulation
    G. Couturier, J.P. Aime, J. Salardenne, R. Boisgard, A. Gourdon, S. Gauthier
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S47-S50
    801 A method to improve the quantitative analysis of SFM images at the nanoscale
    B.A. Todd, S.J. Eppell
    Surface Science, 491 (2001), 3, 473-483
    802 A metrological scanning force microscope
    X. Y., S.T. Smith, P.D. Atherton
    Precision Engineering, 19 (1996), 1, 46-55
    803 A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM) - A new approach to the measurement of adsorption isotherms at the solid-liquid interface
    G. Jordan, C.M. Eggleston
    Geochimica et Cosmochimica Acta, 62 (1998), 11, 1919-1923
    270 A tower-shaped prototypic molecule designed as an atomically sharp tip for AFM applications
    A.V. Rukavishnikov, M.D. Lee, A. Phadke, D.H. LaMunyo, P.A. Petukhov, J.F. Keana
    Tetrahedron Letters, 40 (1999), 35, 6353-6356
    794 Adhesion forces between individual ligand-receptor pairs
    Florin E-L., Moy V.T. and Gaub E.H.
    Science 264 (1994), 415-417
    282 AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips
    G. Kaupp, J. Schmeyers, U. Pogodda, M. Haak, T. Marquardt, M. Plagmann
    Thin Solid Films, 264 (1995), 2, 205-211
    213 AFM imaging with an xy-micropositioner with integrated tip
    P.-F. Indermuhle, V.P. Jaecklin, J. Brugger, C. Linder, N.F. De Rooij, M. Binggeli
    Sensors and Actuators A: Physical, 47 (1995), 1-3, 562-565
    194 AFM observations and simulations of jarosite growth at the molecular scale: probing the basis for the incorporation of foreign ions into jarosite as a storage mineral
    U. Becker, B. Gasharova
    Physics and Chemistry of Minerals, 28 (2001), 8, 545-556
    1645 Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation
    J. S. Villarrubia
    J. Res. Natl. Inst. Stand. Technol. 102, (1997), 4, 425-454
    307 Ambient atomic force microscopy images of stilbite and their interpretation by molecular simulations
    M. Komiyama, A. Miyamoto, Y. Oumi, M. Kubo, K. Tsujimichi
    Applied Surface Science, 121-122 (1997), 543-547
    308 Amplitude, deformation and phase shift in amplitude modulation atomic force microscopy: a numerical study for compliant materials
    A. San Paulo, R. Garca
    Surface Science, 471 (2001), 1-3, 71-79
    320 AN02/DNP-hapten unbinding forces studied by molecular dynamics atomic force microscopy simulations
    B. Heymann, H. Grubmuller
    Chemical Physics Letters, 303 (1999), 1-2, 1-9
    323 Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
    B. Basnar, G. Friedbacher, H. Brunner, T. Vallant, U. Mayer, H. Hoffmann
    Applied Surface Science, 171 (2001), 3-4, 213-225
    1008 Application of neural networks to a scanning probe microscopy system
    L. Hadjiiski, R. Linnemann, M. Stopka, E. Oesterschulze, I. Rangelow, R. Kassing
    Thin Solid Films, 264 (1995), 2, 291-297
    812 Atomic and chemical resolution in scanning force microscopy on ionic surfaces
    A.L. Shluger, A.I. Livshits
    Applied Surface Science, 141 (1999), 3-4, 274-286
    1638 Atomic-force microscopy probe tip visualization and improvement of images using a simple deconvolution procedure
    P. Markiewicz and M. C. Goh
    Langmuir 10 (1994), 5
    435 Atomistic simulations of fluid structure and solvation forces in atomic force microscopy
    D.L. Patrick, R.M. Lynden-Bell
    Surface Science, 380 (1997), 2-3, 224-244
    1011 Automated detection of particles, clusters and islands in scanning probe microscopy images
    M.J.J. Jak, C. Konstapel, A. van Kreuningen, J. Verhoeven, R. van Gastel, J.W.M. Frenken
    Surface Science, 494 (2001), 2, 43-52
    814 Background correction in scanning probe microscope recordings of macromolecules
    J.P.P. Starink, T.M. Jovin
    Surface Science, 359 (1996), 1-3, 291-305
    437 Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy
    T. Arai, M. Tomitori
    Applied Surface Science, 157 (2000), 4, 207-211
    817 Bridge configuration of piezoresistive devices for scanning force microscopes
    O. Ohlsson, J. Schelten, R. Jumpertz, F. Saurenbach
    Sensors and Actuators A: Physical, 70 (1998), 1-2, 88-91
    1104 Calculation of playback signals from MFM images using transfer functions
    S.J.L. Vellekoop, J.J. Miles, J.C. Lodder, L. Abelmann, S. Porthun
    Journal of Magnetism and Magnetic Materials, 193 (1999), 1-3, 474-478
    438 Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy
    S. Hembacher, H. Bielefeldt, F.J. Giessibl, J. Mannhart
    Applied Surface Science, 140 (1999), 3-4, 352-357
    1012 Calibration of transfer standards for SPM
    L. Koenders, G.-S. Peng, Gao-Feng
    Microelectronic Engineering, 41-42 (1998), 615-618
    820 Characterization of an integrated force sensor based on a MOS transistor for applications in scanning force microscopy
    N.F. De Rooij, J. Brugger, A. Tonin, P. Vettiger, T. Akiyama, U. Staufer, H.-R. Hidber
    Sensors and Actuators A: Physical, 64 (1998), 1, 1-6
    1261 Classification of Scanning Probe Microscopies
    Gernot Friedbacher and Harald Fuchs
    Pure Appl. Chem., 71 (1999), 7, pp. 1337-1357
    1108 Comparing the resolution of magnetic force microscopes using the CAMST reference samples
    L. Abelmann, B. Stiefel, K. Babcock, P.J.A. van Schendel, R. Proksch, H.J. Hug, M.E. Best, A. Farley, C. Lodder, M. Haast, T. Pfaffelhuber, G.P. Heydon, A. Moser, S.R. Hoon, S. Porthun
    Journal of Magnetism and Magnetic Materials, 190 (1998), 1-2, 135-147
    1635 Computational model of the imaging process in scanning-x microscopy
    H. Gallarda and R. Jain
    Proceedings of Conference on Integrated Circuit Metrology, Inspection, and Process Control, V, SPIE Vol. 1464 (1991), 459.
    22 Contact resonance imaging - a simple approach to improve the resolution of AFM for biological and polymeric materials
    K. Wadu-Mesthrige, N.A. Amro, J.C. Garno, S. Cruchon-Dupeyrat, G.-Y. Liu
    Applied Surface Science, 175-176 (2001), 391-398
    7 Contrast inversion in nc-AFM on Si(111)7x7 due to short-range electrostatic interactions
    M. Guggisberg, O. Pfeiffer, S. Schar, V. Barwich, M. Bammerlin, C. Loppacher, R. Bennewitz, A. Baratoff, E. Meyer
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S19-S22
    38 Contrast mechanism in non-contact AFM on reactive surfaces
    K. Terakura, R. Perez, I. Stich, M.C. Payne
    Applied Surface Science, 123-124 (1998), 249-254
    824 Contrast mechanism in non-contact SFM imaging of ionic surfaces
    A.I. Livshits, A.L. Shluger, A.L. Rohl
    Applied Surface Science, 140 (1999), 3-4, 327-332
    463 Corrections to the van der Waals forces in application to atomic force microscopy
    M. Bordag, G.L. Klimchitskaya, V.M. Mostepanenko
    Surface Science, 328 (1995), 1-2, 129-134
    465 Correlation between frequency-sweep hysteresis and phase imaging instability in tapping mode atomic force microscopy
    G. Bar, R. Brandsch, M.-H.M.-H. Whangbo
    Surface Science, 436 (1999), 1-3, L715-L723
    973 Deformation, contact time, and phase-contrast in tapping mode scanning force microscopy
    Tamayo J., Garcia R.
    Langmuir 12 (1996), 4430-4435
    830 Dependence of the measured monolayer height on applied forces in scanning force microscopy
    X.D. Liu, M. Hartig, L.F. Chi, H. Fuchs
    Thin Solid Films, 327-329 (1998), 262-267
    1110 Description of magnetic force microscopy by three-dimensional tip Green's function for sample magnetic charges
    H. Saito, S. Ishio, J. Chen
    Journal of Magnetism and Magnetic Materials, 191 (1999), 1-2, 153-161
    468 Description of phase imaging in tapping mode atomic force microscopy by harmonic approximation
    M.-H. Whangbo, R. Brandsch, G. Bar
    Surface Science, 411 (1998), 1-2, L794-L801
    469 Design and application of scanning near-field optical/atomic force microscopy
    T. Ataka, H. Muramatsu, K. Nakajima, N. Chiba, K. Homma, M. Fujihara
    Thin Solid Films, 273 (1996), 1-2, 154-160
    1604 Determining the form of atomic force microscope tips
    P. Siedle, H-J. Butt. E.Bamberg, D.N. Wang, W. Kuhlbrand, J. Zach and M. Haider
    Int. Phys. Conf. Ser. 130 (1993) 361
    499 Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements
    L. Delineau, G. Bar, R. Brandsch, M. Bruch, M.-H. Whangbo
    Surface Science, 444 (2000), 1-3, L11-L16
    75 Fine atomic image of mica cleavage planes obtained with an atomic force microscope (AFM) and a novel procedure for image processing
    M. Baba, S. Kakitani, H. Ishii, T. Okuno
    Chemical Physics, 221 (1997), 1-2, 23-31
    504 Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation
    R.W. Stark, W.M. Heckl
    Surface Science, 457 (2000), 1-2, 219-228
    1023 Fractal analysis of scanning probe microscopy images
    N. Almqvist
    Surface Science, 355 (1996), 1-3, 221-228
    507 Frequency modulation detection atomic force microscopy in the liquid environment
    S.P. Jarvis, T. Ishida, T. Uchihashi, Y. Nakayama, H. Tokumoto
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S129-S132
    508 Frequency shift and energy dissipation in non-contact atomic-force microscopy
    S.H. Ke, T. Uda, K. Terakura
    Applied Surface Science, 157 (2000), 4, 361-366
    518 Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy
    Y. Sugawara, S. Morita
    Applied Surface Science, 140 (1999), 3-4, 406-410
    519 Harmonic responses of a cantilever interacting with elastomers in tapping mode atomic force microscopy
    M.-H. Whangbo, G. Bar, R. Brandsch, L. Delineau
    Surface Science, 448 (2000), 1, L179-L187
    250 How to describe AFM constant force surfaces in repulsive mode?
    E.V. Blagov, G.L. Klimchitskaya, A.A. Lobashov, V.M. Mostepanenko
    Surface Science, 349 (1996), 2, 196-206
    524 How to measure energy dissipation in dynamic mode atomic force microscopy
    H. Fuchs, V.B. Elings, B. Anczykowski, J.P. Cleveland, B. Gotsmann
    Applied Surface Science, 140 (1999), 3-4, 376-382
    45 Imaging of chemical reactivity and buckled dimers on Si(100)2x1 reconstructed surface with noncontact AFM
    T. Tsukamoto, T. Okada, T. Minobe, Y. Sugawara, T. Uchihashi, S. Orisaka, S. Morita
    Applied Surface Science, 140 (1999), 3-4, 304-308
    8 Imaging problems on insulators: What can be learnt from NC-AFM modelling on CaF2
    A.S. Foster, A.L. Rohl, A.L. Shluger
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S31-S34
    225 Impact of atomic relaxation on the breaks of constant force surfaces in AFM
    E.V. Blagov, G.L. Klimchitskaya, V.M. Mostepanenko
    Surface Science, 410 (1998), 2-3, 158-169
    14 Instrumentation of STM and AFM combined with transmission electron microscope
    D. Erts, A. Lohmus, R. Lohmus, H. Olin
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S71-S74
    52 Interaction measurements between a tip and a sample in proximity regions controlled by tunneling current in a UHV STM-AFM
    M. Tomitori, T. Arai
    Applied Surface Science, 144-145 (1999), 501-504
    837 Intercomparison of SEM, AFM, and Electrical Linewidths
    J. S. Villarrubia, R. Dixson, S. Jones, J. R. Lowney, M. T. Postek, R. A. Allen, and M. W. Cresswell
    Metrology, Inspection, and Process Control for Microlithography XIII, Proc. SPIE 3677 (1999), pp. 587-598
    1308 Lateral force microscopy - A quantitative approach
    G.S. Watson, S. Myhra, C.T. Gibson
    Wear, 213 (1997), 1-2, 72-79
    786 Limits of force microscopy
    Smith, D.P.E.
    Rev. Sci. Instrum. 66 (1995), 3191-3195
    1033 Melnikov-Based Dynamical Analysis of Microcantilevers in Scanning Probe Microscopy
    M. Ashhab, M. V. Salapaka, M. Dahleh, I. Mezic
    Nonlinear Dynamics, 20 (1999), 3, 197-220
    1603 Mesoscopic Calibration of an Atomic Force Microscope
    S.S. Sheiko, M. Moller, E.M.C.M. Reuvekamp and H.W. Zandbergen
    Ultramicroscopy 53 (1994) 371-380
    231 Model dependence of AFM simulations in non-contact mode
    I.Y. Sokolov, G.S. Henderson, F.J. Wicks
    Surface Science, 457 (2000), 1-2, 267-272
    612 Molecular dynamics simulation of atomic force microscopy: imaging single-atom vacancies on Ag(001) and Pt(001)
    M. Katagiri, R.M. Lynden-Bell, D.L. Patrick
    Surface Science, 431 (1999), 1-3, 260-268
    881 Molecular dynamics study of scanning force microscopy on self-assembled monolayers
    T. Bonner, A. Baratoff
    Surface Science, 377-379 (1997), 1082-1086
    632 Nanoparticle sizing: a comparative study using atomic force microscopy, transmission electron microscopy, and ferromagnetic resonance
    L.M. Lacava, B.M. Lacava, R.B. Azevedo, Z.G.M. Lacava, N. Buske, A.L. Tronconi, P.C. Morais
    Journal of Magnetism and Magnetic Materials, 225 (2001), 1-2, 79-83
    318 Normal and lateral force investigation using magnetically activated force sensors
    S.P. Jarvis, H. Yamada, K. Kobayashi, A. Toda, H. Tokumoto
    Applied Surface Science, 157 (2000), 4, 314-319
    1450 Novel nanoindentation method for characterising multiphase materials
    N.X. Randall, C. Julia-Schmutz, J.M. Soro, J. von Stebut, G. Zacharie
    Thin Solid Films, 308-309 (1997), 1-4, 297-303
    656 Observation of voltage contrast in non contact resonant mode Atomic Force Microscopy
    P. Girard, G.C. Solal, S. Belaidi
    Microelectronic Engineering, 31 (1996), 1-4, 215-225
    659 On possibility of spin-polarized atomic force microscopy
    H.J. Reittu
    Surface Science, 334 (1995), 1-3, 257-262
    664 Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy
    R. Nishi, I. Houda, T. Aramata, Y. Sugawara, S. Morita
    Applied Surface Science, 157 (2000), 4, 332-336
    665 Phase imaging and stiffness in tapping-mode atomic force microscopy
    M.-H. Whangbo, S.N. Magonov, V. Elings
    Surface Science, 375 (1997), 2-3, l385-l391
    32 Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity-sensitive surfaces
    I. Schmitz, M. Schreiner, G. Friedbacher, M. Grasserbauer
    Applied Surface Science, 115 (1997), 2, 190-198
    1452 Progress in determination of the area function of indenters used for nanoindentation
    K. Herrmann, N.M. Jennett, W. Wegener, J. Meneve, K. Hasche, R. Seemann
    Thin Solid Films, 377-378 (2000), 394-400
    156 Proposal for new atomic force microscopy (AFM) imaging for a high aspect structure (digital probing mode AFM)
    S. Hosaka, T. Morimoto, K. Kuroda, H. Kunitomo, T. Hiroki, T. Kitsukawa, S. Miwa, H. Yanagimoto, K. Murayama
    Microelectronic Engineering, 57-58 (2001), 651-657
    48 Pseudo-non-contact AFM imaging?
    F.J. Wicks, G.S. Henderson, I.Y. Sokolov
    Applied Surface Science, 140 (1999), 3-4, 362-365
    62 Quantitative electrostatic force measurement in AFM
    S. Jeffery, A. Oral, J.B. Pethica
    Applied Surface Science, 157 (2000), 4, 280-284
    221 Quantum oscillations in surface-tip transfer of adatoms on AFM/STM with a dissipative environment
    I.S. Tilinin, M.A. Van Hove, M. Salmeron
    Surface Science, 393 (1997), 1-3, l88-l92
    897 Resonance modes of voltage-modulated scanning force microscopy
    M. Labardi, V. Likodimos, M. Allegrini
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S79-S85
    1636 Restoration of scanning probe microscope images
    G. S. Pingali and R. Jain
    Proceedings IEEE Workshop on Applications of Computer Vision, (1992) pp. 282-289.
    251 Role of the adhesion between a nanotip and a soft material in tapping mode AFM
    F. Dubourg, J.P. Aime
    Surface Science, 466 (2000), 1-3, 137-143
    898 Role of the force of friction on curved surfaces in scanning force microscopy
    J.P. Aime, Z. Elkaakour, S. Gauthier, D. Michel, T. Bouhacina, J. Curely
    Surface Science, 329 (1995), 1-2, 149-156
    29 Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements
    J.C. Arnault, A. Knoll, E. Smigiel, A. Cornet
    Applied Surface Science, 171 (2001), 3-4, 189-196
    984 Scan speed limit in atomic force microscopy
    Butt H.J., Siedle P., Seifert K., Fendler K., Seeger T., Bamberg E., Weisenhorn A.L., Goldie K., Engel A.
    J. Microsc. 169 (1993), 75-84
    916 Scanning force microscopy simulations of well-characterized nanostructures on dielectric and semiconducting substrates
    G. Cohen-Solal, F. Touhari, X. Bouju, M. Devel, C. Girard
    Applied Surface Science, 125 (1998), 3-4, 351-359
    1633 Scanning tunneling microscopy on rough surfaces-deconvolution of constant current images
    G. Reiss, F. Schneider, J. Vancea, and H. Hoffmann
    Appl. Phys. Lett. 57, (1990), 867
    63 Self-assembled monolayers containing biphenyl derivatives as challenge for nc-AFM
    A. Nakasa, U. Akiba, M. Fujihira
    Applied Surface Science, 157 (2000), 4, 326-331
    921 Self-excited force-sensing microcantilevers with piezoelectric thin films for dynamic scanning force microscopy
    T. Itoh, T. Suga
    Sensors and Actuators A: Physical, 54 (1996), 1-3, 477-481
    30 Simulated nc-AFM images of Si(001) surface with nanotube tip
    K. Tagami, N. Sasaki, M. Tsukada
    Applied Surface Science, 172 (2001), 3-4, 301-306
    245 Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging
    M. Komiyama, K. Tsujimichi, K. Tazawa, A. Hirotani, H. Yamano, A. Miyamoto, E. Broclawik, M. Kubo
    Surface Science, 357-358 (1996), 222-227
    698 Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots
    M. Komiyama, K. Tazawa, K. Tsujimichi, A. Hirotani, M. Kubo, A. Miyamoto
    Thin Solid Films, 281-282 (1996), 1-2, 580-583
    243 Simulation of interaction force between Si tip and Si(111)√3×√3-Ag surface of IET structure in noncontact AFM
    N. Sasaki, S. Watanabe, H. Aizawa, M. Tsukada
    Surface Science, 493 (2001), 1-3, 188-193
    9 Simulation of NC-AFM images of xenon(111)
    H. Holscher, W. Allers, U.D. Schwarz, A. Schwarz, R. Wiesendanger
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S35-S38
    11 Simultaneous imaging of tunneling current and damping energy by noncontact-AFM in ultra-high vacuum
    T. Arai, M. Tomitori
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S51-S54
    927 Spin-contrast in non-contact SFM on oxide surfaces: theoretical modelling of NiO(001) surface
    A.S. Foster, A.L. Shluger
    Surface Science, 490 (2001), 1-2, 211-219
    929 Strength measurement and calculations on silicon-based nanometric oscillators for scanning force microcopy operating in the gigahertz range
    H. Kawakatsu, H. Toshiyoshi, D. Saya, K. Fukushima, H. Fujita
    Applied Surface Science, 157 (2000), 4, 320-325
    972 Studies of vibrating atomic force microscope cantilevers in liquid
    Schaeffer T.E., Cleveland J.P., Ohnesorge F.M., Walters D.A., Hansma P.K.
    J Appl Phys 80 (1996), 3622-3627.
    933 Study of tip-sample interaction in scanning force microscopy
    M. Luna, J. Colchero, J. Gomez-Herrero, A.M. Baro
    Applied Surface Science, 157 (2000), 4, 285-289
    1070 Surface analysis algorithms for scanning probe microscopy
    C. Lindquist, F.K. Urban, C.S. Lindquist, F.K.I. Urban
    Thin Solid Films, 270 (1995), 1-2, 399-405
    938 Surface roughness of thin layers - A comparison of XRR and SFM measurements
    Z. Stachura, M. Lekka, O. Filies, J. Lekki, O. Boling, K. Grewer, B. Cleff
    Applied Surface Science, 141 (1999), 3-4, 357-365
    233 The contrast mechanism for true atomic resolution by AFM in non-contact mode: Quasi-non-contact mode?
    I.Y. Sokolov, G.S. Henderson, F.J. Wicks
    Surface Science, 381 (1997), 1, l558-l562
    244 The height dependence of image contrast when imaging by non-contact AFM
    I.Y. Sokolov, G.S. Henderson
    Surface Science, 464 (2000), 2-3, L745-L751
    12 The measurement of hysteretic forces by dynamic AFM
    B. Gotsmann, H. Fuchs
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S55-S58
    766 The role of damping in phase imaging in tapping mode atomic force microscopy
    L. Wang
    Surface Science, 429 (1999), 1-3, 178-185
    950 The role of shear forces in scanning force microscopy: a comparison between the jumping mode and tapping mode
    F. Moreno-Herrero, P.J. de Pablo, J. Colchero, J. Gomez-Herrero, A.M. Baro
    Surface Science, 453 (2000), 1-3, 152-158
    769 Theoretical analysis of atomic-scale friction infrictional-force microscopy
    N. Sasaki, M. Tsukada, S. Fujisawa, Y. Sugawara, S. Morita
    Tribology Letters, 4 (1998), 2, 125-128
    770 Theoretical evaluation of the frequency shift and dissipated power in noncontact atomic force microscopy
    N. Sasaki, M. Tsukada
    Applied Physics A: Materials Science & Processing, 72 (2001), 7, S39-S42
    771 Theoretical simulation of atomic-scale friction in atomic force microscopy
    N. Sasaki, K. Kobayashi, M. Tsukada
    Surface Science, 357-358 (1996), 92-95
    64 Theoretical simulation of noncontact AFM images of Si(111)√3×√3-Ag surface based on Fourier expansion method
    N. Sasaki, H. Aizawa, M. Tsukada
    Applied Surface Science, 157 (2000), 4, 367-372
    47 Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFM
    N. Sasaki, M. Tsukada
    Applied Surface Science, 140 (1999), 3-4, 339-343
    775 Time-frequency modeling of atomic force microscopy
    D. Dragoman, M. Dragoman
    Optics Communications, 140 (1997), 4-6, 220-225
    1362 STM studies: spatial resolution limits to fit observations in nanotechnology
    P. D. Szkutnik, A. Piednoir, A. Ronda, F. Marchi, D. Tonneau, H. Dallaporta, M. Hanbucken
    Applied Surface Science 164 (2000) 169-174
    1324 Mechanism for photon emission from Au nano-hemispheres induced by scanning tunneling microscopy
    Y. H. Liau, N. F. Scherer
    Appl. Phys. Lett. 74 (1999), 26, pp. 3966-3968
    1326 High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
    Appl. Phys. Lett. 74 (1999), 26, p. 4070
    1327 The influence of Coulomb interaction of localized charges on low-temperature scanning tunnelling spectra of surface nanodefects
    Maslova N.S. Oreshkin A.I., Oreshkin S.I., Panov V.I., Savinov S.V., Kalachev A.A.
    J. Phys.: Cond. Matter 13 (2001) 18, 3941-3948
    1331 Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves
    B. Gotsmann, B. Anczykowski, C. Seidel, H. Fuchs
    Applied Surface Science 140 (1999) 314-319
    1332 Hysteresis generated by attractive interaction: oscillating behavior of a vibrating tip-microlever system near a surface
    R. Boisgard, D. Michel, J.P. Aimé
    Surface Science 401 (1998) 199-205
    1333 Scanning tunneling microscope-induced molecular motion and its effect on the image formation
    Matthias Böhringer, Wolf-Dieter Schneider, Richard Berndt
    Surface Science 408 (1998) 72-85
    1334 The use of macros in AFM image analysis and image processing
    Barrett S. D., Bickmore B. R., Rufe E., Hochella M. F., Torzo G. and Cerolini. D
    J. Comp. Ass. Microsc. 10 (1998), 77
    1338 Atomic force microscope for direct comparison measurement of step height and crystalline lattice spacing
    T. Fujii, K. Imabori, H. Kawakatsu, Sh. Watanabe and H. Bleuler
    Nanotechnology 10 (1999) 380-384
    1345 Imitation of non-contact mode while scanning in the presence of an electric double layer?
    I. Yu. Sokolov, G.S. Henderson, F. J. Wicks
    Applied Surface Science 140 (1999) 422-427
    1346 Theoretical and experimental evidence for "true" atomic resolution under non-vacuum conditions
    I. Yu. Sokolov, G.S. Henderson, F. J. Wicks
    J. Appl. Phys. 86 (1999) 10, 5537-5540
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